Method for analyzing HR-TEM micrographs to propose and/or describe structures and their interaction in crystalline materials

一种分析高分辨率透射电镜图像以提出和/或描述晶体材料结构及其相互作用的方法

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Abstract

A general and versatile method for the analysis and processing of HR-TEM data useful for several applications is presented. The first utility is to identify the structures seen in the micrographs; also can be extended to propose the interaction of structure dynamics between various phases; and also it can be hybridized with the chemical method to make a proposal of new structure and/or phase. The general method consisted of four steps: 1) micrograph pretreatment, 2) measurement of planar distances, 3) structure identification, and 4) structure corroboration. Crystallographic planes were immediately identified by comparing the interplanar distances. Next, crystallographic data were collected from the Crystal Structures Database (ICSD) and introduced into Diamond software to visualize the planes in each structure. In addition, from the zone axis point of view it must show the planes aligned, similar as is observed in the HR-TEM micrograph.•It was possible establish the growth mechanism of the different structures by identifying how is the structural interaction between the different oxides and sulfide phases.•Method was successful applied to propose a new TiCoMoS sulfide phase through HR-TEM results.•The method can also be extended to other areas where structural studies with HR-TEM are viable, such as biology, electronics, among others.

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