Excitonic Emission of Monolayer Semiconductors Near-Field Coupled to High-Q Microresonators

单层半导体激子发射与高品质因子微谐振器近场耦合

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Abstract

We present quantum yield measurements of single layer WSe(2) (1L-WSe(2)) integrated with high-Q ( Q > 10(6)) optical microdisk cavities, using an efficient (η > 90%) near-field coupling scheme based on a tapered optical fiber. Coupling of the excitonic emission is achieved by placing 1L-WSe(2) in the evanescent cavity field. This preserves the microresonator high intrinsic quality factor ( Q > 10(6)) below the bandgap of 1L-WSe(2). The cavity quantum yield is QY(c) ≈ 10(-3), consistent with operation in the broad emitter regime (i.e., the emission lifetime of 1L-WSe(2) is significantly shorter than the bare cavity decay time). This scheme can serve as a precise measurement tool for the excitonic emission of layered materials into cavity modes, for both in plane and out of plane excitation.

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