Abstract
Optical anisotropy measurement is essential for material characterization and biological imaging. In order to achieve single-shot mapping of the birefringence parameters of anisotropic samples, a novel polarized light imaging concept is proposed, namely quantitative polarization interference microscopy (QPIM). QPIM can be realized through designing a compact polarization-resolved interference microscopy system that captures interferograms bearing sample's linear birefringence information. To extract the retardance and the orientation angle maps from a single-shot measurement, a mathematical model for QPIM is further developed. The QPIM system is validated by measuring a calibrated quarter-wave plate, whose fast-axis orientation angle and retardance are determined with great accuracies. The single-shot nature of QPIM further allows to measure the transient dynamics of birefringence changes in material containing anisotropic structures. This application is demonstrated by capturing transient retardance changes in a custom-designed parallel-aligned nematic liquid crystal-based device.