Abstract
Accurate measurement of the permittivity and loss tangent of low-loss materials is essential due to their special applications in the field of ultra large scale integrated circuits and microwave devices. In this study, we developed a novel strategy that can accurately detect the permittivity and loss tangent of low-loss materials based on a cylindrical resonant cavity supporting the TE(111) mode in X band (8-12 GHz). Based on an electromagnetic field simulation calculation of the cylindrical resonator, permittivity is precisely retrieved by exploring and analyzing the perturbation of the coupling hole and sample size on the cutoff wavenumber. A more precise approach to measuring the loss tangent of samples with various thicknesses has been proposed. The test results of the standard samples verify that this method can accurately measure the dielectric properties of samples that have smaller sizes than the high Q cylindrical cavity method.