Internal lead shielding for clinical electron treatments

用于临床电子治疗的内部铅屏蔽

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Abstract

Electron beams are often used to treat superficial lesions of the lip, cheek, nose, and ear. Lead is frequently used to block distal structures. It is customary to place an internal bolus of low atomic number in between the tissue and the lead to reduce electron backscatter from the lead. Space for the lead and the internal bolus is quite limited. A previous method for estimating the thickness of the lead plus internal bolus is not self-consistent and leads to a larger than necessary thickness. A new method is described here to provide a quick, accurate, and self-consistent estimate of the minimum necessary thickness of the internal bolus and the lead for incident electron beam energies of 4, 6, 8, 9, and 10 MeV as a function of the thickness of the overlying tissue. This method limits the dose enhancement at the tissue/bolus interface due to the underlying lead to 10%. Measurements made with gafchromic film validate this methodology.

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