Abstract
To overcome the limitations of phase sampling points in testing aspherical surface wavefronts using traditional interferometers, we propose a high-spatial-resolution method based on multi-directional orthogonal lateral shearing interferometry. In this study, we provide a detailed description of the methodology, which includes the theoretical foundations and experimental setup, along with the results from simulations and experiments. By establishing a relational model between the multi-directional differential wavefront and differential Zernike polynomials, we demonstrate high-spatial-resolution wavefront reconstruction using multi-directional orthogonal lateral shearing interferometry. Theoretical calculations and simulations of aspherical surface wavefront testing are followed by experimental verification on an aspherical surface with a known asphericity. Comparing the measurement results with those from the LuphoScan profilometer, we achieve a relative measurement error with an RMS precision better than λ/100.