The interface issue poses a limitation on the fast charging of solid-state batteries (SSBs), with the high-impedance non-Faraday electric field serving as a pivotal factor. However, the mechanism of fast-charging capability degradation triggered by the dynamic evolution of non-Faraday electric fields remains unclear due to the lack of particle-scale nondestructive detection techniques. Here, we dissect the generation and elimination processes of non-Faradaic electric field in segments using the developed operando cryogenic transmission X-ray microscopy (Cryo-TXM). This method accurately tracks the ion self-balancing pathways in LiNi(0.8)Co(0.1)Mn(0.1)O(2) (NCM811) post-fast-charging, elucidating the high polarization during late charging caused by exacerbated irreversible local electric field. By intermittently applying reverse potential during fast charging to alleviate the exacerbation of non-Faradaic electric field at the cathode interface, we achieved a roughly 400% reversible capacity increase of SSBs at 10 C. This insightful dynamic imaging method effectively captures and resolves the transient, opaque signals within SSBs, significantly enhancing their fast-charging performance.
Origin of fast charging in solid-state batteries revealed by Cryo-transmission X-ray microscopy.
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作者:Liu Jiaxuan, Song Yajie, Liu Qingsong, Zhao Wei, An Hanwen, Zhou Zinan, Xu Zihan, Li Menglu, Deng Biao, Wang Jiajun
| 期刊: | Proceedings of the National Academy of Sciences of the United States of America | 影响因子: | 9.100 |
| 时间: | 2024 | 起止号: | 2024 Dec 17; 121(51):e2410406121 |
| doi: | 10.1073/pnas.2410406121 | ||
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