Tin selenide (SnSe) has attracted considerable interest recently on account of its low-symmetry lattice structure, great compatibility with key semiconductor technology, and remarkable electrical and optical performance. SnSe-based polarization-sensitive photodetectors show promising application prospects because of their fast response and excellent photoelectric performance. Here, an in-plane anisotropic SnSe nanosheet was synthesized and reported in detail by applying angle-resolved polarized Raman spectroscopy (ARPRS), polarization-resolved optical microscopy(PROM), angle-resolved optical absorption spectroscopy (AROAS), and other crystal structure characterization methods. Moreover, SnSe crystals exhibit superior polarization detection performance with a high anisotropic photocurrent ratio (2.31 at 1064 nm) due to the structure formed by the Van der Waals superposition of covalently bonded atomic layers. Furthermore, SnSe-based photodetectors have high responsivity (9.27 A/W), high detectivity (4.08Â ÃÂ 10(10) Jones), and fast response (in the order of nanoseconds). These results suggest a new method for fabricating 2D fast-response polarization-sensitive photodetectors in the future.
Wide-spectrum polarization-sensitive and fast-response photodetector based on 2D group IV-VI semiconductor tin selenide.
基于二维 IV-VI 族半导体硒化锡的宽光谱偏振敏感快速响应光电探测器
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作者:Yu Yali, Xiong Tao, Guo Zhengfeng, Hou Shijun, Yang Juehan, Liu Yue-Yang, Gu Honggang, Wei Zhongming
| 期刊: | Fundamental Research | 影响因子: | 6.300 |
| 时间: | 2022 | 起止号: | 2022 Mar 8; 2(6):985-992 |
| doi: | 10.1016/j.fmre.2022.02.008 | ||
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