Multi-parametric interferometric reflectance imaging sensor.

We present a dual-wavelength, multi-parametric Interferometric Reflectance Imaging Sensor (MP-IRIS) for real-time, label free, multiplexed binding kinetic measurements without the "bulk-effect". Our platform dynamically tracks the conditions of the solution and corrects in real time, demonstrating a reduction in bulk effect to 3 pg/mm[Formula: see text] with bulk refractive index change of [Formula: see text] RIU. By incorporating multi-wavelength data acquisition, we improve the repeatability and reduce quantification error due to variation in chip manufacturing and surface treatment. Proof-of-concept DNA hybridization assays validate accurate, multiplexed binding measurements under diverse chip conditions. MP-IRIS retains the high sensitivity of prior IRIS designs, lowering the overall complexity of the system and offering potential applications in small-molecule analysis.