Abstract
A statistical approach to link the results of interlaboratory comparisons with linear trends is proposed. This approach can be applied to the case that the comparison artifacts have the same nominal values or the measured quantities have the same magnitudes. The degrees of equivalence between the pairs of National Metrology Institutes that have not participated in the same comparisons, and their corresponding uncertainties are established. The approach is applied to link the CCEM-K2 and SIM.EM-K2 comparisons for resistance at 1 G Ω level.