Abstract
We have employed finite element analysis to develop computational Seebeck coefficient metrology simulations. This approach enables a unique exploration of multiple probe arrangements and measurement techniques within the same temporal domain. To demonstrate the usefulness of this approach, we have performed these Seebeck coefficient measurement simulations to quantitatively explore perturbations to voltage and temperature correspondence, by comparing simultaneous and staggered data acquisition techniques under the quasi-steady-state condition. The results indicate significant distortions to the Seebeck coefficient and a strong dependence on the time delay, the acquisition sequence, and the probe arrangement.