Abstract
Optimal double sampling plans for lot acceptance based on truncated life tests are derived by minimizing the expected sample size when the lifetime variable follows a Tsallis q-exponential distribution. The proposed test plans significantly reduce the inspection effort with respect to the best single sampling schemes. Some tables and figures are presented to analyze the behavior of the suggested test plans. The results show that the proposed lot inspection scheme clearly outperforms the standard single sampling plan. A justification is provided using a comparative study for existing double sampling plans. Finally, several applications are provided for illustrative purposes.