In-Depth Comparative Study of the Cathode Interfacial Layer for a Stable Inverted Perovskite Solar Cell

对稳定反式钙钛矿太阳能电池阴极界面层的深入对比研究

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Abstract

Achieving long-term device stability is one of the most challenging issues that impede the commercialization of perovskite solar cells (PSCs). Recent studies have emphasized the significant role of the cathode interfacial layer (CIL) in determining the stability of inverted p-i-n PSCs. However, experimental investigations focusing on the influence of the CIL on PSC degradation have not been systematically carried out to date. In this study, a comparative analysis was performed on the PSC device stability by using four different CILs including practical oxides like ZnO and TiO(x) . A new implemented co-doping approach was found to results in high device performance and enhanced device stability. The PSC with a thick film configuration of chemically modified TiO(x) CIL preserves over 77 % of its initial efficiencies of 17.24 % for 300 h under operational conditions without any encapsulation. The PSCs developed are among the most stable reported for methylammonium lead iodide (MAPbI(3) ) perovskite compositions.

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