Abstract
Coherent X-ray diffraction imaging is a lens-less microscopy technique that emerged with the advent of third-generation synchrotrons, modern detectors and computers. It can image isolated micrometre-sized objects with a spatial resolution of a few nanometres. The method is based on the inversion of the speckle pattern in the far field produced by the scattering from the object under coherent illumination. The retrieval of the missing phase is performed using an iterative algorithm that numerically phases the amplitudes from the intensities of speckles measured with sufficient oversampling. Two- and three-dimensional imaging is obtained by simple inverse Fourier transform. This lens-less imaging technique has been applied to various specimens for their structural characterization on the nanoscale. Here, we review the theoretical and experimental elements of the technique, its achievements, and its limitations at third-generation synchrotrons. We also discuss the new opportunities offered by modern fourth-generation synchrotrons and outline the developments necessary to maximize the potential of the technique.