Abstract
This method describes the preparation of Candida albicans specimen for scanning electron microscopy (SEM), starting from specimen collection to obtaining SEM images. Our approach involves preserving cellular structure and preventing cell degradation through chemical fixation and post-fixation without Osmium tetroxide (OsO(4)), followed by air dried specimen placed onto Si substrate. Additionally, the method outlines the steps for mounting the prepared specimen onto SEM sample holder aluminum stubs, followed by coating with an ultrathin gold layer via thermal evaporation to enhance specimen/substrate/stub conductivity. The specimens are then mounted in the SEM sample holder. This step-by-step procedure demonstrates successful morphological analysis of C. albicans, providing a comprehensive and effective specimen preparation for SEM analysis.•Effective preparation of Candida albicans specimens for SEM analysis, preserving cellular structure.•Step-by-step specimen mounting and gold coating for enhanced detailed SEM imaging.•Chemical fixation of yeast cells for electron microscopy visualization.