Abstract
We introduce a novel technique to implement gate functionality for the beam position monitors (BPM) at the National Synchrotron Light Source II (NSLS-II). The functionality, now implemented in FPGA, allows us to acquire two separated bunch-trains' synchronized turn-by-turn (TBT) data simultaneously with the NSLS-II in-house developed BPM system. The gated position resolution is improved about 3 times by narrowing the sampling width. Experimentally we demonstrated that the machine lattice could be transparently characterized with the gated TBT data of a short diagnostic bunch-train Cheng et al., 2017; Li et al., 2017. Other applications, for example, precisely characterizing storage ring impedance/wake-field through recording the beam positions of two separated bunch trains has been experimentally demonstrated. •Gated BPM signal processing improves the position resolution.•Transparent lattice measurement using the gate function with diagnostic bunches.•Collective effect study with simultaneous position measurement from two gates.