Abstract
This paper presents a measurement procedure for analyzing the dielectric properties of cells using descriptive statistics. The study focuses on four cancer cell lines (MDA-MB-231 and MCF-7 breast cancer, SaOS-2, and 143B osteosarcoma) and DMEM culture medium, utilizing the Lorentzian fit model of the return-loss function. The measurements are performed using a circular patch resonator with a 40 mm diameter, powered by a miniVNA operating in the frequency range of 1 MHz to 3 GHz. Eight specimens are prepared for each group to ensure reliability, and the return loss is recorded ten times for each specimen. Various statistical parameters are calculated and evaluated, including the average value, standard deviation, coefficient of variation, and relative error between the average and the first values. The results demonstrate that one single acquisition highly represents the entire set of ten data points, especially for the resonant frequency, with an accuracy error lower than 0.05%. These findings have significant implications for the methodological approach to detecting cells' dielectric properties, as they substantially reduce time and preserve the specimens without compromising the accuracy of the experimental results.