Abstract
Surface plasmon microscopy proves to be a potent tool for capturing interferometric scattering imaging data of individual particles at both micro and nanoscales, offering considerable potential for label-free analysis of bio-particles and bio-molecules such as exosomes, viruses, and bacteria. However, the manual analysis of acquired images remains a challenge, particularly when dealing with dense samples or strong background noise, common in practical measurements. Manual analysis is not only prone to errors but is also time-consuming, especially when handling a large volume of experimental images. Currently, automated methods for sensing and analysis of such data are lacking. In this paper, we develop an accelerated approach for surface plasmon microscopy imaging of individual particles based on combining the interference scattering model of single particle and deep learning processing. We create hybrid datasets by combining the theoretical simulation of particle images with the actual measurements. Subsequently, we construct a neural network utilizing the EfficientNet architecture. Our results demonstrate the effectiveness of this novel deep learning technique in classifying interferometric scattering images and identifying multiple particles under noisy conditions. This advancement paves the way for practical bio-applications through efficient automated particle analysis.