Abstract
We synthesized a Cu(4)I(4)(3-picoline)(4) cluster scintillator with high X-ray attenuation and a 89.25% photoluminescence quantum yield. In situ fabrication yielded screens showing a high light yield (60 617 photons per MeV), low detection limit (0.91 μGy(air) s(-1)), and exceptional resolution (13 lp per mm). Non-destructive testing ability was demonstrated by imaging from plastic to metal.