Three-dimensional structured illumination microscopy with enhanced axial resolution

具有增强轴向分辨率的三维结构照明显微镜

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作者:Xuesong Li, Yicong Wu, Yijun Su, Ivan Rey-Suarez, Claudia Matthaeus, Taylor B Updegrove, Zhuang Wei, Lixia Zhang, Hideki Sasaki, Yue Li, Min Guo, John P Giannini, Harshad D Vishwasrao, Jiji Chen, Shih-Jong J Lee, Lin Shao, Huafeng Liu, Kumaran S Ramamurthi, Justin W Taraska, Arpita Upadhyaya, Patric

Abstract

The axial resolution of three-dimensional structured illumination microscopy (3D SIM) is limited to ∼300 nm. Here we present two distinct, complementary methods to improve axial resolution in 3D SIM with minimal or no modification to the optical system. We show that placing a mirror directly opposite the sample enables four-beam interference with higher spatial frequency content than 3D SIM illumination, offering near-isotropic imaging with ∼120-nm lateral and 160-nm axial resolution. We also developed a deep learning method achieving ∼120-nm isotropic resolution. This method can be combined with denoising to facilitate volumetric imaging spanning dozens of timepoints. We demonstrate the potential of these advances by imaging a variety of cellular samples, delineating the nanoscale distribution of vimentin and microtubule filaments, observing the relative positions of caveolar coat proteins and lysosomal markers and visualizing cytoskeletal dynamics within T cells in the early stages of immune synapse formation.

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