Sequencing trait-associated mutations to clone wheat rust-resistance gene YrNAM

测序性状相关突变以克隆小麦抗锈病基因 YrNAM

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作者:Fei Ni, Yanyan Zheng, Xiaoke Liu, Yang Yu, Guangqiang Zhang, Lynn Epstein, Xue Mao, Jingzheng Wu, Cuiling Yuan, Bo Lv, Haixia Yu, Jinlong Li, Qi Zhao, Qiyu Yang, Jiajun Liu, Juan Qi, Daolin Fu, Jiajie Wu

Abstract

Stripe (yellow) rust, caused by Puccinia striiformis f. sp. tritici (Pst), can significantly affect wheat production. Cloning resistance genes is critical for efficient and effective breeding of stripe rust resistant wheat cultivars. One resistance gene (Yr10CG) underlying the Pst resistance locus Yr10 has been cloned. However, following haplotype and linkage analyses indicate the presence of additional Pst resistance gene(s) underlying/near Yr10 locus. Here, we report the cloning of the Pst resistance gene YrNAM in this region using the method of sequencing trait-associated mutations (STAM). YrNAM encodes a non-canonical resistance protein with a NAM domain and a ZnF-BED domain. We show that both domains are required for resistance. Transgenic wheat harboring YrNAM gene driven by its endogenous promoter confers resistance to stripe rust races CYR32 and CYR33. YrNAM is an ancient gene and present in wild wheat species Aegilops longissima and Ae. sharonensis; however, it is absent in most wheat cultivars, which indicates its breeding value.

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