Microscopic crystallographic analysis of dislocations in molecular crystals

分子晶体中位错的显微晶体学分析

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Abstract

Organic molecular crystals encompass a vast range of materials from pharmaceuticals to organic optoelectronics, proteins and waxes in biological and industrial settings. Crystal defects from grain boundaries to dislocations are known to play key roles in mechanisms of growth(1,2) and in the functional properties of molecular crystals(3-5). In contrast to the precise analysis of individual defects in metals, ceramics and inorganic semiconductors enabled by electron microscopy, substantially greater ambiguity remains in the experimental determination of individual dislocation character and slip systems in molecular materials(3). In large part, nanoscale dislocation analysis in molecular crystals has been hindered by the low electron doses required to avoid irreversibly degrading these crystals(6). Here we present a low-dose, single-exposure approach enabling nanometre-resolved analysis of individual dislocations in molecular crystals. We demonstrate the approach for a range of crystal types to reveal dislocation character and operative slip systems unambiguously.

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