Abstract
We propose a method for integrating confocal amplitude and phase images obtained through dual-comb microscopy (DCM). DCM combines the benefits of confocal laser microscopy and quantitative phase microscopy, offering high axial resolution and scan-less imaging. By leveraging the coherence between confocal amplitude and phase images within the same DCM system, we accurately determine the number of phase wrapping iterations, thereby eliminating ambiguity in phase wrapping. We demonstrate this approach using samples with micrometer-range optical thickness and nanometer-scale surface roughness. The results demonstrate an expanded axial range, spanning from micrometers to millimeters, while maintaining nanometer-level axial resolution. This integrated DCM imaging technique enables the simultaneous acquisition of confocal amplitude image and absolute phase image, thus enhancing its potential for wide-axial-dynamic-range imaging across various applications.