Abstract
Perfect absorbers can be used in photodetectors, thermal imaging, microbolometers, and thermal photovoltaic solar energy conversions. The spectrum of Mid-infrared (MIR) wavelengths offers numerous advantages across a wide range of applications. In this work, we propose a fractal MIR broadband absorber which is composed of three layers: metal, dielectric, and metal (MDM), with the metal being considered as n-type doped silicon (D-Si) and the dielectric is silicon carbide (SiC). The architectural design was derived from the Sierpinski carpet fractal, and different building blocks were simulated to attain optimal absorption. The 3D finite element method (FEM) approach using COMSOL Multiphysics software is used to obtain numerical results. The suggested fractal absorber exhibits high absorption enhancement for MIR in the range between 3 and 9 µm. D-Si exhibits superior performance compared to metals in energy harvesting applications that utilize plasmonics at the mid-infrared range. Typically, semiconductors exhibit rougher surfaces than noble metals, resulting in lower scattering losses. Moreover, silicon presents various advantages, including compatibility with complementary metal-oxide-semiconductor (CMOS) and simple manufacturing through conventional silicon fabrication methods. In addition, the utilization of doped silicon material in the mid-IR region facilitates the development of microscale integrated plasmonic devices.