Abstract
A TiN-based substrate with high reusability presented high-sensitivity refractive index measurements in a home-built surface plasmon resonance (SPR) heterodyne phase interrogation system. TiN layers with and without additional inclined-deposited TiN (i-TiN) layers on glass substrates reached high bulk charge carrier densities of 1.28 × 10(22) and 1.91 × 10(22) cm(-3), respectively. The additional 1.4 nm i-TiN layer of the nanorod array presented a detection limit of 6.1 × 10(-7) RIU and was higher than that of the 46 nm TiN layer at 1.2 × 10(-6) RIU when measuring the refractive index of a glucose solution. Furthermore, the long-term durability of the TiN-based substrate demonstrated by multiple processing experiments presented a high potential for various practical sensing applications.