Abstract
Optical materials are widely used in large optical systems such as lithography machines and astronomical telescopes. However, optical materials inevitably produce subsurface damage (SSD) during lapping and polishing processes, degrading the laser damage threshold and impacting the service life of the optical system. The large surface roughness of the lapped optical materials further increases the difficulty of the nondestructive detection of SSD. Quantum dots (QDs) show great development potential in the nondestructive detection of SSD in lapped materials. However, existing QD-based SSD detection methods ignore the polarization sensitivity of QDs to excitation light, which affects the detection accuracy of SSD. To address this problem, this paper explores the fluorescence polarization properties of QDs in the SSD of optical materials. First, the detection principle of SSD based on the fluorescence polarization of QDs is investigated. Subsequently, a fluorescence polarization detection system is developed to analyze the fluorescence polarization properties of QDs in SSD. Finally, the SSD is detected based on the studied polarization properties. The results show that the proposed method effectively improves the detection rate of SSD by 10.8% and thus provides guidance for evaluating the quality of optical material and optimizing optical material processing technologies. The research paradigm is equally applicable to biomedicine, energy, optoelectronics, and the environment, where QDs have a wide range of applications.