Analyzing the microstructure and related properties of 2D materials by transmission electron microscopy

利用透射电子显微镜分析二维材料的微观结构及相关性能

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Abstract

Two-dimensional materials such as transition metal dichalcogenide and graphene are of great interest due to their intriguing electronic and optical properties such as metal-insulator transition based on structural variation. Accordingly, detailed analyses of structural tunability with transmission electron microscopy have become increasingly important for understanding atomic configurations. This review presents a few analyses that can be applied to two-dimensional materials using transmission electron microscopy.

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