Abstract
Two evaluation concepts for nondestructive depth-resolved X-ray residual stress analysis in the near-surface region of materials with cubic symmetry and nearly single crystalline structure are introduced by simulated examples. Both concepts are based on the same data acquisition strategy, which consists in the determination of lattice-spacing depth profiles along the 〈hkl〉 poles by stepwise sample rotation around the scattering vector. Segmentation of these profiles parallel to the sample surface provides the lattice strain state as a function of depth. The first evaluation concept extends the crystallite group method developed for materials with pronounced crystallographic texture by the feature of depth resolution and can be applied to samples with arbitrary orientation. The second evaluation concept, which adapts the linear regression approach of the sin(2)ψ method for the case of single crystalline materials, is restricted to samples with (001) orientation. The influence of the strain-free lattice parameter a (0) on residual stress analysis using both evaluation concepts is discussed on the basis of explicitly derived relations.