Abstract
The development of new graphene-based materials necessitates the application of suitable material imaging techniques, especially for the identification of defects in the graphene structure and its continuity. For this purpose, it is natural to use one of the main properties of graphene-electrical conductivity. In this work, we prepare a 9 cm(2) large-area monolayer graphene membrane on porous scaffolding sealed with either GO or rGO. Then, we use electrostatic force microscopy (EFM) AFM mode along with SE and AEE SEM modes to characterize the as-prepared graphene membranes thoroughly. The combination of SEM-AEE and AFM-EFM techniques not only assesses the quality of graphene itself but also characterizes the selectivity and effectiveness of masking graphene layer defects by applying GO or rGO. This makes these methods valuable in optimizing the production of advanced graphene nanocomposites such as semipermeable membranes.