Abstract
Sweet corn is highly susceptible to low temperatures, especially during seed germination, which severely affects plant growth and crop yield. This study used 100 sweet corn micro-core germplasms to evaluate two key germination traits under cold stress: seed storage material utilization efficiency (SRUE) and mobilization weight (WMSR). To investigate the genetic basis of cold germination in sweet corn, we selected the BLINK model for GWAS due to its ability to minimize false positives. A total of nine SNPs were found to be significantly associated with cold germination. These SNPs explained between 9.8% and 17.2% of the phenotypic variance (PVE). Within the confidence interval, 63 functionally annotated genes were identified. Fourteen candidate genes associated with cold germination were identified through GO functional analysis and the functional expression of homologous genes. A literature analysis indicated that these genes are primarily involved in seed germination, cold tolerance, and responses to other abiotic stresses. These findings enhance our understanding of the genetic and molecular mechanisms underlying cold germination, establishing a theoretical foundation for breeding cold-tolerant sweet corn varieties.