A material change for ultra-high precision force sensing

用于超高精度力传感的材料变更

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Abstract

An original form of photonic force microscope has been developed. Operating with a trapped lanthanide-doped crystal of nanometric dimensions, a minimum detected force of the order of 110 aN and a force sensitivity down to 1.8 fN/ [Formula: see text] have been realised. This opens up new prospects for force sensing in the physical sciences.

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