The Influence of the Thickness of Compact TiO(2) Electron Transport Layer on the Performance of Planar CH(3)NH(3)PbI(3) Perovskite Solar Cells

致密TiO₂电子传输层厚度对平面CH₃NH₃PbI₃钙钛矿太阳能电池性能的影响

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Abstract

In recent years, lead halide perovskites have attracted considerable attention from the scientific community due to their exceptional properties and fast-growing enhancement for solar energy harvesting efficiency. One of the fundamental aspects of the architecture of perovskite-based solar cells (PSCs) is the electron transport layer (ETL), which also acts as a barrier for holes. In this work, the influence of compact TiO(2) ETL on the performance of planar heterojunction solar cells based on CH(3)NH(3)PbI(3) perovskite was investigated. ETLs were deposited on fluorine-doped tin oxide (FTO) substrates from a titanium diisopropoxide bis(acetylacetonate) precursor solution using the spin-coating method with changing precursor concentration and centrifugation speed. It was found that the thickness and continuity of ETLs, investigated between 0 and 124 nm, strongly affect the photovoltaic performance of PSCs, in particular short-circuit current density (J(SC)). Optical and topographic properties of the compact TiO(2) layers were investigated as well.

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