Abstract
A bandpass filter integrated metalens based on electromagnetically induced transparency (EIT) for long-wavelength infrared (LWIR) imaging is designed in this paper. The bandwidth of the metalens, which is a diffractive optical element, decreases significantly with the increase of the aperture size to a fixed f-number, which leads to the decline of imaging performance. The same material composition and preparation process of the metalens and the EIT metasurface in the long-wavelength infrared make it feasible that the abilities of focusing imaging and filtering are integrated into a metasurface device. With the purpose of validating the feasibility of this design method, we have designed a 300-μm-diameter integrated metalens whose f-number is 0.8 and the simulation was carried out. The introduction of EIT metasurface does not affect the focusing near the diffraction limit at the target wavelength, and greatly reduces the influence of stray light caused by non-target wavelength incident light. This bandpass filter integrated metalens design method may have a great potential in the field of LWIR compact optical systems.