Abstract
Coatings deposited on a material surface are effective way of changing its surface properties. For increasing or decreasing radiation heat transfer, coatings with high or low emissivity are used. Measurement of spectral emissivity is a fundamental step to effective use of coatings for this application. Up to now the measurement methods are focused on bulk samples and mainly opaque ones. Here we present a method enabling measurement of emissivity of semitransparent coating itself, although it is deposited on a substrate. The method is based on measurement of transmittance and reflectance using an integration sphere system and Fourier transform infrared (FTIR) spectrometer for samples with two different coating thicknesses deposited on transparent substrates. Measured transmittance of the coating indicates spectral regions of potential emissivity differences using different substrates. From all the measured values, spectral emissivity can be characterized for different coating thicknesses. The spectral range of the method is from 2 μm to 20 μm. The measurement is done at ambient temperature enabling measurement of samples sensitive to heating like biomedical or nanocoatings. The method was validated on known bulk samples and an example of semitransparent coating measurement is shown on high-temperature high-emissivity coating.