Abstract
Metal halide perovskites offer exceptional sensitivity for direct x-ray detection through direct current (DC) signals, but the DC bias-induced ion migration poses substantial challenges to their signal consistency and operational stability. In this work, we propose a capacitance signal-based imaging strategy that uses an alternating current (AC) bias to suppress ion migration and eliminate nonlinear responses. A quantitative correlation between capacitance changes and x-ray dose rate is established, enabling stable, high-resolution imaging. Using this method, we achieve three-dimensional internal structure reconstruction with a simple single-pixel detector. This approach overcomes intrinsic material limitations and enhances signal reliability, providing a promising pathway toward the commercialization of low-cost, high-performance perovskite-based x-ray imaging and computed tomography systems.