Sensitive photodetection below silicon bandgap using quinoid-capped organic semiconductors

利用醌式封端的有机半导体实现硅带隙以下的灵敏光电探测

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Abstract

High-sensitivity organic photodetectors (OPDs) with strong near-infrared (NIR) photoresponse have attracted enormous attention due to potential applications in emerging technologies. However, few organic semiconductors have been reported with photoelectric response beyond ~1.1 μm, the detection limit of silicon detectors. Here, we extend the absorption of organic small-molecule semiconductors to below silicon bandgap, and even to 0.77 eV, through introducing the newly designed quinoid-terminals with high Mulliken-electronegativity (5.62 eV). The fabricated photodiode-type NIR OPDs exhibit detectivity (D(*)) over 10(12) Jones in 0.41 to 1.2 μm under zero bias with a maximum of 2.9 × 10(12) Jones at 1.02 μm, which is the highest D(*) for reported OPDs in photovoltaic-mode with response spectra beyond 1.1 μm. The high D(*) in 0.9 to 1.2 μm is comparable to those of commercial InGaAs photodetectors, despite the detection limit of our OPDs is shorter than InGaAs (~1.7 μm). A spectrometer prototype with a wide measurable region (0.4 to 1.25 μm) and NIR imaging under 1.2-μm illumination are demonstrated successfully in OPDs.

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