A novel method for the genome-wide high resolution analysis of DNA damage

一种全基因组高分辨率分析DNA损伤的新方法

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作者:Yumin Teng, Mark Bennett, Katie E Evans, Huayun Zhuang-Jackson, Andy Higgs, Simon H Reed, Raymond Waters

Abstract

DNA damage occurs via endogenous and exogenous genotoxic agents and compromises a genome's integrity. Knowing where damage occurs within a genome is crucial to understanding the repair mechanisms which protect this integrity. This paper describes a new development based on microarray technology which uses ultraviolet light induced DNA damage as a paradigm to determine the position and frequency of DNA damage and its subsequent repair throughout the entire yeast genome.

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