Protection by organic ions against DNA damage induced by low energy electrons

有机离子对低能电子引起的DNA损伤的保护作用

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Abstract

It is well known that electrons below 15 eV induce strand breaks in DNA essentially via the formation of transient anions which decay by dissociative electron attachment (DEA) or into dissociative electronics states. The present article reports the results of a study on the influence of organic ions on this mechanism. tris and EDTA are incorporated at various concentrations within DNA films of different thicknesses. The amino group of tris molecules and the carboxylic acid function of ethylenediamine tetra-acetic acid (EDTA) molecules together can be taken as simple model for the amino acids components of proteins, such as histones, which are intimately associated with the DNA of eukaryotic cells. The yield of single strand breaks induced by 10 eV electrons is found to decrease dramatically as a function of the number of organic ions/nucleotide. As few as 2 organic ions/nucleotide are sufficient to decrease the yield of single strand breaks by 70%. This effect is partly explained by an increase in multiple inelastic electrons scattering with film thickness but changes in the resonance parameters can also contribute to DNA protection. This can occur if the electron captures cross section and the lifetime of the transient anions (i.e., core-excited resonances) formed at 10 eV are reduced by the presence of organic ions within the grooves of DNA. Moreover, it is proposed that the tris molecules may participate in the repair of DNA anions [such as G(-H)(-)] induced by DEA on DNA bases.

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