Abstract
Heterogeneity effects often limit the accuracy of synchrotron X-ray fluorescence microprobe elemental analysis data to ± 30%. The difference in matrix mass absorption at Kα and Kβ fluorescence energies of a particular element can be exploited to yield information on the average depth-position of the element or account for heterogeneity effects. Using this technique, the heterogeneous distribution of Cu in a simple layered sample could be resolved to a 2 × 2 × 10 (x, y, z, where z is the depth coordinate) micrometer scale; a depth-resolution limit was determined for the first transition metal series and several other elements in calcite and iron oxide matrices. For complex heterogeneous systems, determination of average element depth may be computationally limited but the influence of heterogeneity on fluorescence data may still be assessed. We used this method to compare solid-state diffusion with sample heterogeneity across the Ni-serpentine/calcite boundary of a rock from Panoche Creek, California. We previously reported that Ni fluorescence data may indicate solid state diffusion; in fact, sample heterogeneity in the depth dimension can also explain the Ni fluorescence data. Depth heterogeneity in samples can lead to misinterpretation of synchrotron X-ray microprobe results unless care is taken to account for the influence of heterogeneity on fluorescence data.