Abstract
Electrical connectors play a vital role in ensuring reliable signal transmission in high-frequency microsystems. This study explores the impact of microscale scratch-induced surface roughness on the alternating current (AC) contact impedance of RF coaxial connectors. Unlike traditional approaches that assume idealized surface conditions, controlled micro-defects were introduced at the central contact interface to establish a quantitative relationship between surface morphology and signal degradation. An equivalent circuit model was constructed to account for local impedance variations and the cumulative effects of cascaded connector interfaces. The model was validated using S-parameter measurements obtained from vector network analyzer (VNA) testing, showing strong agreement with simulation results. Experimental results reveal that the low-roughness (0.4 μm) contact surfaces lead to degraded signal integrity due to insufficient micro-contact formation. In contrast, scratch-induced moderate roughness (0.8-4.8 μm) improves transmission performance, although signal quality declines as roughness increases within this range. These effects are further amplified in multi-connector configurations due to accumulated impedance mismatches. This work provides new insight into the coupling between microscale surface features and frequency-domain transmission characteristics, offering practical guidance for surface engineering, contact design, and the development of miniaturized, high-reliability radio frequency interconnects for next-generation communication systems.