Charged grain boundaries and carrier recombination in polycrystalline thin film solar cells

多晶薄膜太阳能电池中的带电晶界和载流子复合

阅读:1

Abstract

We present analytical relations for the dark recombination current of a pn+ junction with positively charged columnar grain boundaries in the high defect density regime. We consider two defect state configurations relevant for positively charged grain boundaries: a single donor state and a continuum of both acceptors and donors. Compared to a continuum of acceptor+donor states, or to the previously studied single acceptor+donor state, the grain boundary recombination of a single donor state is suppressed by orders of magnitude. We show numerically that superposition holds near the open-circuit voltage Voc , so that our dark J(V) relations determine Voc for a given short circuit current Jsc . We finally explicitly show how Voc depends on the these two grain boundary defect state configurations.

特别声明

1、本页面内容包含部分的内容是基于公开信息的合理引用;引用内容仅为补充信息,不代表本站立场。

2、若认为本页面引用内容涉及侵权,请及时与本站联系,我们将第一时间处理。

3、其他媒体/个人如需使用本页面原创内容,需注明“来源:[生知库]”并获得授权;使用引用内容的,需自行联系原作者获得许可。

4、投稿及合作请联系:info@biocloudy.com。