STRUCTURED CORRELATION DETECTION WITH APPLICATION TO COLOCALIZATION ANALYSIS IN DUAL-CHANNEL FLUORESCENCE MICROSCOPIC IMAGING

结构化相关性检测及其在双通道荧光显微成像共定位分析中的应用

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Abstract

Current workflows for colocalization analysis in fluorescence microscopic imaging introduce significant bias in terms of the user's choice of region of interest (ROI). In this work, we introduce an automatic, unbiased structured detection method for correlated region detection between two random processes observed on a common domain. We argue that although intuitive, using the maximum log-likelihood statistic directly suffers from potential bias and substantially reduced power. Therefore, we introduce a simple size-based normalization to overcome this problem. We show that scanning using the proposed statistic leads to optimal correlated region detection over a large collection of structured correlation detection problems.

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