Abstract
Occurrence level comparison of catastrophic failures due to radiation effects on electronic components or collision with space debris are studied in two types of satellites: cubesats and microsats. Low Earth Orbit (LEO) case studies are proposed, and the level of catastrophic failure occurrence is quantified for the same mission duration. The variation in the occurrence of failures is studied and there is a determination of which is more likely. Emphasis is placed on examining how an increase in space debris would affect the reliability of future space missions.