Extraction technique of trap states based on transient photo-voltage measurement

This article puts forward a technique for extracting the density of trap states (DOS(T)) distribution based on the transient photo-voltage (TPV) measurement result. We prove that when the TPV result is linear, the DOS(T) distribution is exponential type and vice versa. Compared to the approach based on the space charge limited current measurement, the method given in this paper has the advantage of requiring less calculation. The results obtained by our method provides a guidance for preparing less trap states solar cells.