Explaining Evaporation-Triggered Wetting Transition Using Local Force Balance Model and Contact Line-Fraction

使用局部力平衡模型和接触线分数解释蒸发引发的润湿转变

阅读:4
作者:Rama Kishore Annavarapu, Sanha Kim, Minghui Wang, A John Hart, Hossein Sojoudi

Abstract

Understanding wettability and mechanisms of wetting transition are important for design and engineering of superhydrophobic surfaces. There have been numerous studies on the design and fabrication of superhydrophobic and omniphobic surfaces and on the wetting transition mechanisms triggered by liquid evaporation. However, there is a lack of a universal method to examine wetting transition on rough surfaces. Here, we introduce force zones across the droplet base and use a local force balance model to explain wetting transition on engineered nanoporous microstructures, utilizing a critical force per unit length (FPL) value. For the first time, we provide a universal scale using the concept of the critical FPL value which enables comparison of various superhydrophobic surfaces in terms of preventing wetting transition during liquid evaporation. In addition, we establish the concept of contact line-fraction theoretically and experimentally by relating it to area-fraction, which clarifies various arguments about the validity of the Cassie-Baxter equation. We use the contact line-fraction model to explain the droplet contact angles, liquid evaporation modes, and depinning mechanism during liquid evaporation. Finally, we develop a model relating a droplet curvature to conventional beam deflection, providing a framework for engineering pressure stable superhydrophobic surfaces.

特别声明

1、本页面内容包含部分的内容是基于公开信息的合理引用;引用内容仅为补充信息,不代表本站立场。

2、若认为本页面引用内容涉及侵权,请及时与本站联系,我们将第一时间处理。

3、其他媒体/个人如需使用本页面原创内容,需注明“来源:[生知库]”并获得授权;使用引用内容的,需自行联系原作者获得许可。

4、投稿及合作请联系:info@biocloudy.com。