Abstract
Ceramics based on bismuth titanate with added SiO(2) and Nd(2)O(3) were synthesized from the Bi(2)O(3)-TiO(2)-SiO(2)-Nd(2)O(3) system through rapid melt quenching followed by controlled cooling. By adjusting the initial compositions and applying heat treatments between 1450 °C and 1100 °C, either homogeneous crystalline products or multiphase glass-ceramics were obtained. The identified crystalline phases included Bi(12)TiO(20) and Bi(4)Ti(3)O(12), coexisting with amorphous networks enriched in silicon, bismuth, titanium, and aluminum oxides. In previous investigations, the materials were characterized using X-ray diffraction, scanning electron microscopy, and Fourier-transform infrared spectroscopy, which collectively confirmed the presence of both ordered and disordered structural domains within the bulk samples. Electrical properties were evaluated through measurements of conductivity (4 × 10(-9) S/m to 30 S/m), dielectric constant (real part from 10 to 5 × 10(3) and imaginary part from 5 to 5 × 10(4)), and dielectric loss (0.02 to ~100) over the frequency range 1 Hz-1 MHz. These results provide a foundation for rational control of phase evolution in this quaternary oxide system and highlight strategies for tailoring the functional properties of glass-ceramic materials for dielectric applications. The aim of the present study is to investigate the relationship between phase composition, structural features, and dielectric behavior in cast Bi-Ti-Si-Nd glass-ceramics. Particular attention is given to the influence of the amorphous network containing SiO(2) as a traditional glass former, as well as the formation of amorphous crosslinking Si-O-Ti structures acting as non-traditional glass formers.