Abstract
A 3D-printable, ARDUINO-based multipurpose X-ray stage of compact dimensions enabling in situ electric field and temperature-dependent measurements is put into practice and tested here. It can be routinely applied in combination with a technique of structural characterization of materials. Using high-performance X-ray laboratory equipment, two investigations were conducted to illustrate the device's performance. The lattice characteristics and microstructure evolution of piezoelectric ceramics of barium titanate, BaTiO(3) (BT), and barium calcium zirconate titanate, with compositions of (Ba(0.92)Ca(0.08)) (Ti(0.95)Zr(0.05))O(3) (BC8TZ5), were studied as a function of the applied electric field and temperature. The X-ray stage is amenable as an off-the-shelf device for a diffraction line in a synchrotron. It provides valuable information for poling piezoceramics and subsequent optimization of their performance.