Abstract
In various applications, such as computer vision, medical imaging and robotics, three-dimensional (3D) image registration is a significant step. It enables the alignment of various datasets into a single coordinate system, consequently providing a consistent perspective that allows further analysis. By precisely aligning images we can compare, analyze, and combine data collected in different situations. This paper presents a novel approach for 3D or z-stack microscopy and medical image registration, utilizing a combination of conventional and deep learning techniques for feature extraction and adaptive likelihood-based methods for outlier detection. The proposed method uses the Scale-invariant Feature Transform (SIFT) and the Residual Network (ResNet50) deep neural learning network to extract effective features and obtain precise and exhaustive representations of image contents. The registration approach also employs the adaptive Maximum Likelihood Estimation SAmple Consensus (MLESAC) method that optimizes outlier detection and increases noise and distortion resistance to improve the efficacy of these combined extracted features. This integrated approach demonstrates robustness, flexibility, and adaptability across a variety of imaging modalities, enabling the registration of complex images with higher precision. Experimental results show that the proposed algorithm outperforms state-of-the-art image registration methods, including conventional SIFT, SIFT with Random Sample Consensus (RANSAC), and Oriented FAST and Rotated BRIEF (ORB) methods, as well as registration software packages such as bUnwrapJ and TurboReg, in terms of Mutual Information (MI), Phase Congruency-Based (PCB) metrics, and Gradiant-based metrics (GBM), using 3D MRI and 3D serial sections of multiplex microscopy images.