Low-field MRI's Spark on Implant Safety: A Closer Look at Radiofrequency Heating

低场磁共振成像技术在植入物安全性方面引发关注:深入了解射频加热技术

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Abstract

Advances in low-field magnetic resonance imaging (MRI) are making imaging more accessible without significant losses in image quality. In addition to being more cost-effective and easier to place without as much needed infrastructure, it has been publicized that the lower field strengths make MRI safer for patients with implants. To test this claim, we conducted a total of 368 simulations with wires of various lengths and geometries in a gel phantom during radiofrequency (RF) exposure at 23 MHz and 63.6 MHz (corresponding to MRI at 0.55 T and 1.5 T). Our results showed that heating in the gel around wire tips could be higher in certain cases at 0.55 T. To examine the impact on real patients, we simulated two models of patients with deep brain stimulation (DBS) implants of different lengths. These simulations provide quantitative evidence that low-field MRI is not always safer, and this paper serves to illustrate some of the basic principles involved in RF heating of elongated implants in MRI environments.Clinical Relevance- This paper illustrates the physical concepts of resonance and inductive coupling in RF heating during MRI scanning with implants through systematic simulations and discusses the impact of these principles in practice.

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