Abstract
Being an important part of aerial insulated cable, the semiconductive shielding layer is made of a typical polymer material and can improve the cable transmission effects; the structural parameters will affect the cable quality directly. Then, the image processing of the semiconductive layer plays an essential role in the structural parameter measurements. However, the semiconductive layer images are often disturbed by the cutting marks, which affect the measurements seriously. In this paper, a novel method based on the convolutional neural network is proposed for image segmentation. In our proposed strategy, a deep fully convolutional network with a skip connection algorithm is defined as the main framework. The inception structure and residual connection are employed to fuse features extracted from the receptive fields with different sizes. Finally, an improved weighted loss function and refined algorithm are utilized for pixel classification. Experimental results show that our proposed algorithm achieves better performance than the current algorithms.